The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Aug. 28, 2020
Applicant:

Canon Medical Systems Corporation, Otawara, JP;

Inventors:

Isao Nawata, Otawara, JP;

Takeshi Yamauchi, Utsunomiya, JP;

Shoichi Kanayama, Otawara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/51 (2006.01); G01N 21/552 (2014.01); G01N 21/41 (2006.01);
U.S. Cl.
CPC ...
G01N 21/51 (2013.01); G01N 21/552 (2013.01); G01N 2021/4166 (2013.01);
Abstract

According to one embodiment, a sample inspection apparatus includes a photodetection circuitry, an image sensor, processing circuitry, and an output interface. The photodetection circuitry has light incident on an optical waveguide in an inspection container and detects the light having propagated within the optical waveguide and coming out of the optical waveguide. The image sensor acquires an image signal for the optical waveguide, using scattered light originated from the light propagating within the optical waveguide. The processing circuitry acquires one or more inspection index values based on at least one of an output of the photodetection circuitry or an output of the image sensor. The output interface outputs a result of processing by the processing circuitry.


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