The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Sep. 21, 2018
Applicant:

The United States of America As Represented BY the Secretary of the Navy, Newport, RI (US);

Inventor:

Andrew J Hull, Portsmouth, RI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/00 (2006.01); G01N 3/34 (2006.01);
U.S. Cl.
CPC ...
G01N 3/34 (2013.01); G01N 2203/0005 (2013.01); G01N 2203/0032 (2013.01); G01N 2203/0075 (2013.01); G01N 2203/0282 (2013.01); G01N 2203/0641 (2013.01); G01N 2203/0688 (2013.01);
Abstract

A method is provided for increasing accuracy in measuring complex Young's modulus and complex shear modulus of a material using a processing system. The material is tested to obtain an experimental frequency response transfer function of normal displacement to input force. A model panel is developed in the processing system as a modeled frequency response transfer function. The modeled transfer function is used at a range of fixed frequencies to calculate displacements of the model panel divided by the input force while varying material parameters. The modeled frequency response transfer function is compared with the experimental frequency response transfer function to compute error function values. These values indicate the most accurate material property values as those minimizing the computed error function values.


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