The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Jun. 07, 2021
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Fatih Yaman, Princeton, NJ (US);

Eduardo Mateo Rodriguez, Tokyo, JP;

Shinsuke Fujisawa, Princeton, NJ (US);

Hussam Batshon, Monroe, NJ (US);

Kohei Nakamura, Tokyo, JP;

Takanori Inoue, Tokyo, JP;

Yoshihisa Inada, Tokyo, JP;

Takaaki Ogata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/331 (2013.01);
Abstract

Aspects of the present disclosure describe a method for estimating mode field distribution in optical fibers from guided acoustic-wave Brillouin scattering wherein light for which the optical mode-field distribution is determined remains in the optical fibers and the distribution is made for light inside the fiber, and not at a fiber/air interface or other perturbation points to the fiber resulting in a more accurate representation of the optical mode-field distribution in the fiber. Since light is always in the fiber during the determination, no complicated fiber preparation steps or procedures are required and the mode-field distribution is determined as an average distribution along the length of the fiber under test.


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