The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
May. 17, 2019
The Regents of the University of Michigan, Ann Arbor, MI (US);
Steven T. Cundiff, Ann Arbor, MI (US);
Chris Smallwood, Ann Arbor, MI (US);
Eric Martin, Ann Arbor, MI (US);
THE REGENTS OF THE UNIVERSITY OF MICHIGAN, Ann Arbor, MI (US);
Abstract
A method is presented for determining path length fluctuations in an interferometer using a reference laser with an arbitrary frequency with respect to the measured light. The method includes: injecting reference light along signal paths of the interferometer; measuring interference between the reference light at an output of the interferometer; determining an optical phase difference between the reference light in the two signal paths of the interferometer by measuring intensity modulation of the interference between the reference light and subtracting an intended frequency modulation from the measured intensity modulation; accumulating an unwrapped phase difference between the reference light in the two signal paths of the interferometer, where the unwrapped phase difference is defined in relation to a reference; and determining path length fluctuation of light in the interferometer using the unwrapped phase difference.