The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Nov. 19, 2019
Hitachi Astemo, Ltd., Hitachinaka, JP;
Yuki Isoya, Hitachinaka, JP;
Hiroaki Hoshika, Hitachinaka, JP;
Hitachi Astemo, Ltd., Hitachinaka, JP;
Abstract
Provided is a physical quantity measurement device capable of reducing a frequency analysis error of a gas flow rate as compared with the related art. A physical quantity measurement deviceincludes a flow rate sensorand a signal processing unit. The signal processing unithas a buffer, an offset adjustment unit, a gain calculation unit, a correction calculation unit, and a frequency analysis unit. The bufferstores a flow rate data based on an output signal of the flow rate sensorfor a predetermined period. The offset adjustment unitadjusts the zero point of the flow rate waveform. The gain calculation unitcalculates a correction gain of the flow rate waveform whose zero point has been adjusted. The correction calculation unitperforms the correction by multiplying the flow rate waveform whose zero point has been adjusted by the correction gain. The frequency analysis unitperforms a frequency analysis calculation of the corrected flow rate waveform and stores the data obtained by the calculation in the buffer. The gain calculation unitcalculates the correction gain at which the overflow does not occur in the frequency analysis unit