The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Apr. 08, 2019
Applicant:

Jian Liu, Saratoga, CA (US);

Inventor:

Jian Liu, Saratoga, CA (US);

Assignee:

PolarOnyx, Inc., Chapel Hill, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/34 (2014.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); G01N 21/19 (2006.01); G01N 21/71 (2006.01); G01N 21/88 (2006.01); G01N 21/17 (2006.01); G01B 11/30 (2006.01); B22F 10/20 (2021.01); B22F 10/36 (2021.01); B22F 10/28 (2021.01); B22F 10/30 (2021.01); B22F 10/50 (2021.01); B22F 12/90 (2021.01); B29C 64/393 (2017.01); B23K 26/354 (2014.01); G01J 5/00 (2022.01); G01J 5/80 (2022.01);
U.S. Cl.
CPC ...
B23K 26/354 (2015.10); B22F 10/20 (2021.01); B22F 10/28 (2021.01); B22F 10/30 (2021.01); B22F 10/36 (2021.01); B22F 10/50 (2021.01); B22F 12/90 (2021.01); B23K 26/34 (2013.01); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01B 11/30 (2013.01); G01B 11/303 (2013.01); G01J 5/0003 (2013.01); G01N 21/1702 (2013.01); G01N 21/19 (2013.01); G01N 21/718 (2013.01); G01N 21/88 (2013.01); B22F 2999/00 (2013.01); G01J 5/80 (2022.01); G01J 2005/0077 (2013.01); G01N 2021/1706 (2013.01); G01N 2201/06113 (2013.01); Y02P 10/25 (2015.11);
Abstract

Methods and apparatuses for manufacturing are disclosed, including (a) providing an apparatus having: a laser; scanner; powder injection system; powder spreading system; dichroic filter; imager-and-processor; and computer; (b) programming the computer with specifications of a sample; (c) using the computer to set initial parameters based on the sample specifications; (d) adjusting a stage to position the sample; (e) focusing and scanning electromagnetic radiation onto the sample while powder is concurrently injected onto the sample in order to deposit a layer; (f) capturing two-dimensional images of the sample and probing the sample to determine whether the deposited layer was manufactured per the specifications; (g) use the computer to adjust the three-dimensional manufacturing parameters based on the determination made in step (f) prior to additively manufacturing a subsequent layer or making repairs; and (h) repeating steps (d), (e), (f), and (g) until the manufacture is complete. Other embodiments are described and claimed.


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