The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Apr. 11, 2019
Applicant:
University of Florida Research Foundation, Inc., Gainesville, FL (US);
Inventors:
Sanjiv Singh Samant, Gainesville, FL (US);
Lucas M. Rolison, Los Alamos, NM (US);
James Edward Baciak, Gainesville, FL (US);
Assignee:
UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INCORPORATED, Gainesville, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/02 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/483 (2013.01); A61B 6/025 (2013.01); A61B 6/032 (2013.01); A61B 6/4078 (2013.01); A61B 6/466 (2013.01); A61B 6/5205 (2013.01);
Abstract
X-ray backscatter imaging (XBI) methods and systems are provided that enable depth-sensitive information to be obtained from images acquired during a single scan from a single side of an object being imaged. The depth-sensitive information is used in combination with other image information acquired during the scan to produce high-resolution 2-D or 3-D images, where at least one of the dimensions of the 2-D or 3-D image corresponds to depth in the object.