The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Jun. 19, 2019
Koninklijke Philips N.v., Eindhoven, NL;
Yael Haya Nae, Haifa, IL;
Andrei Feldman, Haifa, IL;
Idan Mishlovsky, Kiryat Bailik, IL;
Suresh Narayanan, San Marcos, CA (US);
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to optimizing values for scan parameters for a scan of an object. An object specific exposure time is determined based on a maximal required value of a z-dependent tube current by exposure time product along a z-axis of the object and a maximal available tube current value of a tube used for the scan of the object (). The maximal available tube current value depends on a tube voltage and maximal electric power of the tube at given focal spot area () and the z-dependent tube current by exposure time product profile is based on a dose index value or a pixel noise index value for the scan of the object, the tube voltage, and a z-dependent object size along the z-axis (). The object specific exposure time is used for determining values of the scan parameters for the scan of the object ().