The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Apr. 30, 2020
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Shuo Zhang, Beijing, CN;
Hao Zhang, Beijing, CN;
Lili Chen, Beijing, CN;
Hongzhen Xue, Beijing, CN;
Minglei Chu, Beijing, CN;
Guixin Yan, Beijing, CN;
Yukun Sun, Beijing, CN;
Chenxi Zhao, Beijing, CN;
Zehua Dong, Beijing, CN;
Xiangjun Peng, Beijing, CN;
Yaoyu Lv, Beijing, CN;
Yachong Xue, Beijing, CN;
Huidong He, Beijing, CN;
Qingwen Fan, Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
Embodiments of the present disclosure relate to a method for analyzing an imaging quality of an imaging system. The imaging system comprises a spatial light modulator. The spatial light modulator comprises pixel units arranged in an array. The method comprises obtaining a transmittance distribution function of the spatial light modulator based on a structural parameter of the pixel unit, wherein the structural parameter is an aperture ratio. The imaging quality analysis parameter of the imaging system is obtained based on the transmittance distribution function of the spatial light modulator. Then, the imaging quality of the imaging system is analyzed based on the imaging quality analysis parameter.