The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Dec. 20, 2021
Applicant:

Kyocera Document Solutions Inc., Osaka, JP;

Inventors:

Rui Hamabe, Osaka, JP;

Kazunori Tanaka, Osaka, JP;

Kanako Morimoto, Osaka, JP;

Takuya Miyamoto, Osaka, JP;

Koji Sato, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00082 (2013.01); H04N 1/00005 (2013.01); H04N 1/0009 (2013.01); H04N 1/00015 (2013.01); H04N 1/00037 (2013.01); H04N 1/00068 (2013.01);
Abstract

An image processing apparatus includes an anomaly detecting unit configured to detect anomalies included in a target image; and an anomaly exclusion processing unit configured to exclude a specific anomaly among the detected anomalies. Further, the anomaly exclusion processing unit excludes one of an anomaly and another anomaly among the detected anomalies, if (a) a detection area of the anomaly, a detection area of the other anomaly, and an overlapping area of the detection areas of the anomaly and the other anomaly satisfy a predetermined condition and (b) a type of the anomaly and a type of the other anomaly are different from each other.


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