The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Jul. 28, 2020
Applicant:

Dell Products L. P., Round Rock, TX (US);

Inventors:

Karthik Ranganathan, Round Rock, TX (US);

Sathish Kumar Bikumala, Round Rock, TX (US);

Amit Sawhney, Round Rock, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 41/5009 (2022.01); G06F 40/205 (2020.01); G10L 15/02 (2006.01); G06F 17/15 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H04L 41/5009 (2013.01); G06F 17/15 (2013.01); G06F 40/205 (2020.01); G06N 20/00 (2019.01); G10L 15/02 (2013.01);
Abstract

In some examples, a server may determine that a case, created to address an issue of a computing device, is closed and perform an analysis of a communication session between a user and a technician and the steps taken by the technician to resolve the issue. Machine learning may be used on results of the analysis to predict potential pain points. For example, steps that take longer than average and during which particular words spoken by the user increase in pitch and/or volume may be predicted to be potential pain points. The machine learning may create questions for inclusion in a custom survey based on the potential pain points. The custom survey may be presented to the user. The answers may be correlated with the potential pain points to determine actual pain points in the steps taken to resolve the issue.


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