The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Apr. 08, 2022
Applicant:

Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Ziheng Liu, Beijing, CN;

Jiannan Li, Beijing, CN;

Fei Su, Beijing, CN;

Huaiyu He, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0422 (2013.01); H01J 49/0009 (2013.01); H01J 49/0468 (2013.01);
Abstract

The present disclosure relates to the technical field of calibration of basic parameters of mass spectrometers, and provides a method for on-orbit calibration of basic parameters of a mass spectrometer. Based on the characteristic that a molten silicate mineral can adsorb a gas in an environment, under vacuum conditions, a silicate mineral is heated to obtain the molten silicate mineral. The molten silicate mineral is put in an environment with a standard gas for adsorption, rapid cooling is conducted to obtain a standard sample, and the standard sample is preloaded into a thermal control device of the mass spectrometer. When the mass spectrometer enters a definitive orbit for testing a substance, on-orbit heating is conducted on the standard sample to make the adsorbed standard gas released into the mass spectrometer so as to achieve the calibration of the basic parameters of the mass spectrometer.


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