The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Apr. 29, 2020
Applicant:
Sequenom, Inc., San Diego, CA (US);
Inventors:
Chen Zhao, San Diego, CA (US);
Zeljko Dzakula, San Diego, CA (US);
Cosmin Deciu, San Diego, CA (US);
Sung Kyun Kim, San Diego, CA (US);
Amin R. Mazloom, Del Mar, CA (US);
Gregory Hannum, San Diego, CA (US);
Mathias Ehrich, San Diego, CA (US);
Assignee:
Sequenom, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 20/10 (2019.01); C12Q 1/6869 (2018.01); C12Q 1/6883 (2018.01); G16B 30/10 (2019.01); G16B 30/00 (2019.01); G16B 40/00 (2019.01); G16B 25/10 (2019.01);
U.S. Cl.
CPC ...
G16B 20/10 (2019.02); C12Q 1/6869 (2013.01); C12Q 1/6883 (2013.01); G16B 25/10 (2019.02); G16B 30/10 (2019.02); G16B 30/00 (2019.02); G16B 40/00 (2019.02);
Abstract
Provided herein are methods, processes and apparatuses for non-invasive assessment of genetic variations that make use of decision analyses. The decision analyses sometimes include segmentation analyses and/or odds ratio analyses.