The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Oct. 05, 2018
Nec Solution Innovators, Ltd., Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Kazuki Sekiya, Tokyo, JP;
Shigeharu Taniguchi, Tokyo, JP;
Toshiyuki Kamiya, Tokyo, JP;
Hiroaki Ochiai, Tokyo, JP;
Yurika Nagoshi, Tokyo, JP;
Wei Guo, Tokyo, JP;
Yue Mu, Tokyo, JP;
Masayuki Hirafuji, Tokyo, JP;
Seishi Ninomiya, Tokyo, JP;
Daisuke Takata, Tokyo, JP;
NEC Solution Innovators, Ltd., Tokyo, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
A system acquiring data for phenotyping on a farm field where crops are bred. The device includes: an information storage unit storing farm field information, an imaging condition, and aerial images of the farm field linked with imaging condition; a classification unit classifying the aerial images into a plurality of image groups having different imaging altitude ranges on the basis of an imaging altitude included in the imaging condition; an image processing unit creating image-processed data from at least one of the image groups and imaging condition and analyzes a trait of in the farm field from the image-processed data; a visualization unit visualizing image-processed data obtained in the image processing unit; a processed information storage unit storing, as processed information, data obtained in the image processing unit and visualization unit; and an output unit outputting data obtained in the image processing unit and the visualization unit.