The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Mar. 05, 2018
Applicant:

Omron Corporation, Kyoto, JP;

Inventor:

Masashi Kurita, Kizugawa, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/44 (2022.01); G06K 9/62 (2022.01); G06V 10/46 (2022.01);
U.S. Cl.
CPC ...
G06V 10/443 (2022.01); G06K 9/627 (2013.01); G06K 9/629 (2013.01); G06V 10/462 (2022.01);
Abstract

Provided in the present disclosure are a method, an apparatus and a system for determining feature data of image data, and a storage medium. Wherein, the method comprises: acquiring features of image data, the features comprising a first feature and a second feature, wherein, the first feature is extracted from the image data using a first model, the first model being trained in a machine learning manner, and the second feature is extracted from the image data using a second model, the second model being constructed based on a pre-configured data processing algorithm; and determining feature data based on the first feature and the second feature. The present disclosure solves the technical problem that features recognized by the AI may not be consistent with human recognized features.


Find Patent Forward Citations

Loading…