The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Jan. 05, 2021
Applicant:

Applied Research Associates, Inc., Albuquerque, NM (US);

Inventors:

Dirk B. Warnaar, Raleigh, NC (US);

Lance E. Besaw, Avon Lake, OH (US);

Assignee:

Applied Research Associates, Inc., Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/13 (2022.01); G06V 10/20 (2022.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06V 10/255 (2022.01); G06K 9/6256 (2013.01); G06V 20/13 (2022.01);
Abstract

Methods and media for determining a list of geographic location candidates from an image of an environment are described. Open-source data indicative of the Earth's surface may be obtained and compared with images obtained from online sources. The images may be automatically analyzed using a plurality of modular convolution neural networks to determined probabilities of interest, environment, and if the image is locatable. Further, the resulting images may be analyzed for skyline and ridgeline depth orders and Region of Interest. A geolocation depicted in the image may be determined by comparing the results of the analysis with global geographic data.


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