The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Jan. 05, 2021
Qualcomm Incorporated, San Diego, CA (US);
Jayakrishnan Unnikrishnan, Jersey City, NJ (US);
Avdhut Joshi, Carlsbad, CA (US);
Shivam Agarwal, San Diego, CA (US);
Yoga Y Nadaraajan, San Diego, CA (US);
Amir Salimi, La Jolla, CA (US);
Urs Niesen, Berkeley Heights, NJ (US);
Sree Sesha Aravind Vadrevu, San Diego, CA (US);
Gautam Sachdeva, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Techniques and systems are provided for determining one or more sizes of one or more objects. For example, a bounding region identifying a first object detected in an image can be obtained. A map including map points can also be obtained. The map points correspond to one or more reference locations in a three-dimensional space. The bounding region identifying the first object can be associated with at least one map point of the map points included in the map. Using the bounding region and the at least one map point, an estimated three-dimensional position and an estimated size of the first object detected in the image can be determined. In some examples, other information can be used to estimate the estimated three-dimensional position and an estimated size of the first object, such as radar information and/or other information.