The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Jul. 20, 2020
Applicant:

Novatek Microelectronics Corp., Hsinchu, TW;

Inventors:

Li-Chieh Chen, Hsinchu, TW;

Yen-Tao Liao, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30108 (2013.01);
Abstract

The disclosure provides a method and an image processor for computing decay factors for display degradation compensation. The method includes the following steps. A sequence of frames including a current frame are received. Whether the current frame is a dynamic frame or a static frame is determined. When the current frame is the dynamic frame, accumulation on decay factors is performed. When the current frame is the static frame, accumulation on the decay factors is not performed.


Find Patent Forward Citations

Chen, Li-Chieh. (2022). Method and image processor of computing decay factors for display degradation compensation (U.S. Patent No. 11461888). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11461888

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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