The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Feb. 14, 2020
Applicant:
Pratt & Whitney Canada Corp., Longueuil, CA;
Inventors:
Mario Blais, Varennes, CA;
Clement Drouin Laberge, Terrebonne, CA;
Assignee:
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/50 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 5/50 (2013.01); G06T 7/70 (2017.01); G06T 2207/20221 (2013.01);
Abstract
Methods, systems and devices for inspecting workpieces are described. The method comprises acquiring partial measurement data from a plurality of workpieces associated with a batch of workpieces; composing an inspection data set from the partial measurement data; comparing the inspection data set to a reference data set defining tolerances for the workpieces; and accepting and rejecting the batch of workpieces based on the comparing of the inspection data set to the reference data set.