The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

May. 10, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Ripon Saha, Santa Clara, CA (US);

Xiang Gao, Singapore, SG;

Mukul Prasad, San Jose, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/02 (2006.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06F 7/58 (2006.01); G10L 15/16 (2006.01); G06K 9/62 (2022.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06N 3/086 (2013.01); G06F 7/58 (2013.01); G06F 17/18 (2013.01); G06K 9/6267 (2013.01); G06N 3/0472 (2013.01); G10L 15/16 (2013.01);
Abstract

According to an aspect of an embodiment, operations may include selecting, from a training dataset, a first data point as a seed data point. The operations may further include generating a population of data points by application of a genetic model on the seed data point. The population of data points may include the seed data point and a plurality of transformed data points of the seed data point. The operations may further include determining a best-fit data point in the generated population of data points based on application of a fitness function on the generated population of data points. The operations may further include executing a training operation on the DNN based on the determined best-fit data point. The operations may further include obtaining a trained DNN for the first data point based on the training operation on the DNN based on the determined best-fit data point.


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