The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Sep. 29, 2020
Applicants:

Atlassian Pty Ltd., Sydney, AU;

Atlassian Inc., San Francisco, CA (US);

Inventors:

Yash Sharma, Sydney, AU;

Austin Byrne, Sydney, AU;

Perrin Alexander Stephenson, Sydney, AU;

Itzchak Feldman Perka, Sydney, AU;

James Benjamin McCullough, West Ryde, AU;

Anushka Mudholkar, Sydney, AU;

Tarunveer Singh, The Ponds, AU;

Hideyoshi Cheong, Sydney, AU;

Stephen David Lee, Sydney, AU;

Assignees:

ATLASSIAN PTY LTD., Sydney, AU;

ATLASSIAN US, INC, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/242 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/242 (2019.01); G06F 16/2282 (2019.01);
Abstract

Systems and methods for automatically creating and managing electronic data tables are disclosed. The method includes receiving a metric request descriptor from a client device, the metric request descriptor including at least information for creating a metric query and an identifier of an electronic data table; automatically generating a custom metric query based on the information for creating the metric query and one or more predefined metric templates; creating the electronic data table based on the identifier of the electronic data table received in the metric request descriptor; applying the custom metric query to a data store storing a plurality of event records; extracting metric data from the data store based on the custom metric query; and storing the metric data in the electronic data table.


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