The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Jun. 19, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jang Seon Park, Gwangju-si, KR;

Jong Un Kim, Seoul, KR;

Ju Chan Lee, Seoul, KR;

Hyung Lae Eun, Seongnam-si, KR;

Dong Kim, Hwaseong-si, KR;

In Hoon Park, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/445 (2018.01); G06F 12/02 (2006.01); G06N 5/02 (2006.01); G06F 1/20 (2006.01); G06N 20/00 (2019.01); G06F 1/3296 (2019.01);
U.S. Cl.
CPC ...
G06F 9/44505 (2013.01); G06F 1/206 (2013.01); G06F 12/0238 (2013.01); G06N 5/02 (2013.01); G06N 20/00 (2019.01); G06F 1/3296 (2013.01); G06F 2212/1016 (2013.01); G06F 2212/1032 (2013.01); G06F 2212/202 (2013.01); G06F 2212/7206 (2013.01); Y02D 10/00 (2018.01);
Abstract

An electronic device includes: a memory device; a nonvolatile memory configured to store a plurality of first configuration parameters respectively corresponding to operating voltages of the memory device and a plurality of second configuration parameters respectively corresponding to operating temperatures of the memory device; and a memory controller configured to: determine a value of a third configuration parameter corresponding to an operating voltage of the memory device among the plurality of first configuration parameters stored in the nonvolatile memory without performing a training operation, determine a value of a fourth configuration parameter corresponding to an operating temperature of the memory device among the plurality of second configuration parameters stored in the nonvolatile memory without performing the training operation, and drive the memory device according to the determined values of the third and the fourth configuration parameters.


Find Patent Forward Citations

Loading…