The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Dec. 28, 2018
Siemens Aktiengesellschaft, Munich, DE;
Ming Yu, Wuhan, CN;
Zhou Yuan, Wuhan, CN;
Yi Liu, Wuhan, CN;
Qi Wang, Wuhan, CN;
Yue Hua Zhang, Wuhan, CN;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A data analysis method, device and system are disclosed. In an embodiment, the method includes performing data analysis on the devices by an application by collecting at least one key performance indicator of the devices, estimating the performance of the application according to the result of the data analysis, generating an application upgrade requirement on the basis of the performance estimation result, and sending the upgrade requirement to an industrial cloud; receiving a context data requirement generated by the industrial cloud based upon of the upgrade requirement, collecting context data from the devices according to the context data requirement, and returning the context data to the industrial cloud; and downloading from the industrial cloud the application updated on the basis of the context data. The data analysis mechanism reduces the development process of custom and special applications by automatically upgrading to adapt to changes in field application conditions.