The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Feb. 26, 2020
Applicant:
Pratt & Whitney Canada Corp., Longueuil, CA;
Inventors:
Mario Blais, Varennes, CA;
Clement Drouin Laberge, Terrebonne, CA;
Assignee:
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/65 (2018.01); G05B 23/02 (2006.01); G01D 1/00 (2006.01); G01D 1/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0235 (2013.01); G01D 1/00 (2013.01); G01D 1/02 (2013.01); G05B 23/0221 (2013.01); G06F 8/65 (2013.01);
Abstract
There are described a method, apparatus, and kit for validating an upgrade to a data acquisition system (DAS). The method comprises acquiring measurement data from a composite part using an upgraded DAS, the composite part representing a family of parts and having features from different parts of the family of parts incorporated thereon; comparing the measurement data to reference data defining tolerances for the measurement data; and validating the upgrade to the DAS based on the comparing of the measurement data to the reference data.