The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Nov. 05, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Mitsunori Watanabe, Yamanashi, JP;

Takayuki Tamai, Yamanashi, JP;

Kazuomi Maeda, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4063 (2006.01); G06N 20/00 (2019.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4063 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G05B 2219/23246 (2013.01);
Abstract

In a controller and a machine learning device capable of suppressing an influence of an abnormal value based on noise, etc., the machine learning device included in the controller includes a state observation unit for acquiring input data including at least one of internal data and external data of the manufacturing machine controlled by the controller, an input safety circuit for detecting an abnormality in the input data and outputting safe input data, a machine learning unit for executing learning of a learning model and inference using the learning model based on the safe input data and outputting inference data as an inference result, an output safety circuit for detecting an abnormality in the inference data and outputting safe inference data, and an output unit for outputting output data based on the safe inference data.


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