The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Aug. 13, 2019
Applicant:
Tintometer, Gmbh, Dortmund, DE;
Inventor:
Perry Palumbo, Fort Collins, CO (US);
Assignee:
TINTOMETER, GMBH, Dortmund, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01); G02B 27/10 (2006.01); G02B 27/09 (2006.01); G01J 1/04 (2006.01); G01J 1/16 (2006.01);
U.S. Cl.
CPC ...
G02B 27/10 (2013.01); G01J 1/0477 (2013.01); G02B 27/0972 (2013.01); G01J 1/0414 (2013.01); G01J 1/16 (2013.01);
Abstract
Embodiments of the present invention include a backscatter reductant anamorphic beam sampler. The beam sampler can be implemented to measure a power of a reference beam generated by an electromagnetic radiation source in proportion to a power of a working beam. The beam sampler can provide astigmatic correction to a divergence of the working beam along one axis orthogonal to a direction of propagation. The beam sampler can further be implemented to prevent backscatter reentrant radiation from impinging upon a photodetector of the beam sampler resulting in a reduction of error and instability in an assay of the working beam.