The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Apr. 05, 2020
Fujifilm Corporation, Tokyo, JP;
Shuji Ono, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are an imaging apparatus capable of acquiring an image having a small transmission wavelength shift at a plurality of wavelengths and an image processing apparatus capable of measuring a subject on the basis of an image which has a small transmission wavelength shift and which is acquired at a plurality of wavelengths. High image height rays imaged at a position of which an image height is high is incident at a large angle with respect to the optical axis. Therefore, the transmission wavelength shift increases. However, in the imaging apparatus according to the first aspect, the first optical system causes the high image height rays to be incident into the first optical filter and the second optical filter in a state where the upper ray and the lower ray are parallel. Accordingly, in the first and second optical filters, the transmission wavelength shift due to an difference in incident angle of the high image height rays is suppressed, and an image with a small transmission wavelength shift can be acquired simultaneously at a plurality of wavelengths.