The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Oct. 10, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Daisuke Ikefuji, Tokyo, JP;

Taichi Tanaka, Tokyo, JP;

Osamu Hoshuyama, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G01S 13/00 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9023 (2013.01); G01S 13/003 (2013.01); G01S 13/885 (2013.01);
Abstract

A synthetic aperture radar signal processing deviceincludes a persistent scatterer extraction unitwhich extracts, from time-series observation data related to an observation target observed from a plurality of observation directions by a radar, a plurality of persistent scatterers in respective observation directions; a persistent scatterer grouping unitwhich groups the plurality of persistent scatterers in each of the observation directions; a group selection unitwhich selects, in each of the observation directions, a persistent scatterer group that includes the persistent scatterers included in an analysis target from among groups generated by grouping; and a displacement speed processing unitwhich synthesize displacement speeds of the selected persistent scatterer groups.


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