The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Mar. 26, 2019
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Fumio Ohtomo, Asaka, JP;

Kaoru Kumagai, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 17/08 (2006.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4816 (2013.01); G01S 7/4808 (2013.01); G01S 17/08 (2013.01);
Abstract

A surveying device body includes a distance measuring section to measure a distance to the measurement target, an optical axis deflector that deflects distance measuring light with respect to a reference optical axis, a measurement direction imaging section that obtains an observation image, and an attitude detector that detects an incline of the surveying device body. A computation controller displays a portion of the observation image on the display unit, computes a direction angle of the distance measuring optical axis on the basis of a detection result of the attitude detector and a deflection angle of the distance measuring optical axis with respect to the reference optical axis, and measures the measurement target on the basis of the direction angle and a distance measurement result of the distance measuring section using a reference point as a reference.


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