The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Apr. 14, 2020
Donghua Pan, Harbin, CN;
Shengxin Lin, Harbin, CN;
Liyi LI, Harbin, CN;
Yuhang GE, Harbin, CN;
Yinxi Jin, Harbin, CN;
Donghua Pan, Harbin, CN;
Shengxin Lin, Harbin, CN;
Liyi Li, Harbin, CN;
Yuhang Ge, Harbin, CN;
Yinxi Jin, Harbin, CN;
Harbin Institute of Technology, Harbin, CN;
Abstract
Provided is a method for designing a magnetic gradiometer based on the combined influence of multiple influencing parameters. The method takes into consideration of synergetic interaction of the influencing parameters on the performance of a magnetic gradiometer. It analyzes detection errors within the entire zone of all possible directions and attitudes of a magnetic target under the influence of various influencing parameters, uses the detection accuracy and detection success rate to measure the performance of the magnetic gradiometer accurately and objectively, and finally obtains the influence rule of the influencing parameters on the performance of the magnetic gradiometer. Based on the knowledge of the combined influence of multiple influencing parameters, the magnetic gradiometer can be designed to have high detection accuracy and success rate and high cost-efficiency.