The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Feb. 04, 2020
Applicants:

Hitachi, Ltd., Tokyo, JP;

Hitachi Industrial Equipment Systems Co., Ltd., Tokyo, JP;

Inventors:

Kenta Sugiyama, Tokyo, JP;

Shigeki Okuno, Tokyo, JP;

Kunihiro Fujiki, Tokyo, JP;

Yoshinori Takeyama, Tokyo, JP;

Hidehiko Fushimi, Tokyo, JP;

Hideaki Kataho, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 35/0099 (2013.01); G01N 35/04 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/0465 (2013.01);
Abstract

In a first transfer station, a second transfer station, and a third transfer station, a plurality of sample containers are transferred while being stored from a transfer source rack to a transfer destination rack row. In this case, for each of the sample containers to be a transfer target, a specific transfer destination rack is selected from the transfer destination rack row based on a content of processing to be applied in the future to a sample within the sample container.


Find Patent Forward Citations

Loading…