The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Aug. 27, 2019
Applicant:

Exxonmobil Upstream Research Company, Spring, TX (US);

Inventors:

Hubert E. King, Jr., Flemington, NJ (US);

Michael G. Myers, Lebanon, NJ (US);

William A. Lamberti, Stewartsville, NJ (US);

Antonio S. Buono, Spring, TX (US);

James H. Macquaker, The Woodlands, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/24 (2006.01); G01N 15/08 (2006.01); G01N 23/203 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 33/241 (2013.01); G01N 15/088 (2013.01); G01N 23/203 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30181 (2013.01);
Abstract

A method of analyzing a rock sample includes analyzing one or more large-area, low-resolution micrographs to identify areas requiring higher-resolution imaging, and selecting one or more analysis regions from the areas requiring higher-resolution imaging. Multi-spectral imaging is used on the one or more analysis regions to obtain one or more high-resolution, multi-spectral images, and one or more features of the rock sample are identified from the corresponding one or more high-resolution, multi-spectral images. The method further includes upscaling the one or more high-resolution, multi-spectral images and thereby geo-locating the features of the rock sample to key regions of the rock sample.


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