The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Aug. 02, 2018
Applicants:
Carl Zeiss Jena Gmbh, Jena, DE;
Carl Zeiss Spectroscopy Gmbh, Jena, DE;
Inventors:
Michael Rode, Jena, DE;
Alexandre Gatto, Jena MĂĽnchenroda, DE;
Arnaud Deparnay, Erfurt, DE;
Michael Helgert, Jena, DE;
Assignees:
Carl Zeiss Jena GmbH, Jena, DE;
Carl Zeiss Spectroscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); F24F 11/63 (2018.01); B60H 1/00 (2006.01); G01N 33/00 (2006.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); F24F 110/50 (2018.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); B60H 1/008 (2013.01); F24F 11/63 (2018.01); G01N 33/0027 (2013.01); G01N 33/0063 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); F24F 2110/50 (2018.01); G01N 2201/06113 (2013.01);
Abstract
For the purpose of gas quality monitoring, a spectroscopic examination of a gas sample from a space () to be monitored is carried out, e.g. by Raman spectroscopy. The spectroscopic examination yields a measurement spectrum extending over a wavelength range. A deviation of the measurement spectrum from at least one comparison sample () is then detected. Depending on the detected deviation, a gas quality warning (QW) is produced.