The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Jul. 07, 2020
Sakura Finetek U.s.a., Inc., Torrance, CA (US);
Amit D. Shah, Redondo Beach, CA (US);
Cristina R. Flores, Downey, CA (US);
SAKURA FINETEK U.S.A., INC., Torrance, CA (US);
Abstract
Apparatuses for measuring sample materials (such as tissue samples) and associated methodologies and instrumentation involve a spectroscopy system or device configured with a sample measuring device (e.g., an attenuated total reflection infrared (ATR-IR) sample measuring device) including a crystal defining a sample receiving surface/interface operatively connected to an IR source and an IR detector. The sample receiving surface/interface facilitates assessing presence (and optionally, amount) of a fixative (e.g., formaldehyde) in sample materials, tissue samples for example. Measurements are taken at one or multiple locations within a sample placement structure/area, which can be provided in the form of a probe or a raised piercing structure containing one or more ATR-IR (or other) sample measuring devices. The probe can include a piercing structure or mechanism at a distal (open) end of the probe configured to create a passage to a selected location (depth) within the sample material in a minimally invasive manner so that the sample is not severely damaged during testing.