The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Jun. 23, 2020
Applicant:

Csem Centre Suisse D'electronique ET DE Microtechnique Sa—recherche ET Développement, Neuchâtel, CH;

Inventors:

Markus Lützelschwab, Egolzwil, CH;

Branislav Timotijevic, Lausanne, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/3504 (2014.01); G01N 21/03 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01N 21/0303 (2013.01); G01N 33/0036 (2013.01);
Abstract

Gas measurement sensor including: a measurement chamber including an inlet and outlet for a gaseous sample to be measured; an infrared light source producing substantially collimated infrared light and to direct the infrared light into the measurement chamber; a beam splitter situated in the measurement chamber so as to receive the infrared light and to split the infrared light into a reference beam and a measurement beam such that the measurement beam has a longer pathway through the measurement chamber than the reference beam; a reference infrared detector arranged to receive the reference beam; and a measurement infrared detector arranged to receive the measurement beam. The beam splitter is arranged to reflect a first portion of the infrared light by specular reflection so as to form the reference beam, and to reflect a second portion of the infrared light by specular reflection so as to form the measurement beam.


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