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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11459537 B1

PDFFull Text
Date of Patent:
Oct. 04, 2022

Filed:

Apr. 19, 2018

Sensor device and detection apparatus

Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Ichiro Takemura, Kanagawa, JP;

Daisuke Yamaguchi, Kanagawa, JP;

Yoshio Goto, Kanagawa, JP;

Kyohei Yoshimitsu, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:

K&L Gates LLP

Primary Examiner:

William H Beisner

Assistant Examiner:

Danielle B Henkel

Int. Cl.
CPC ...
C12M 1/00 (2006.01); C12M 1/12 (2006.01); G01N 21/75 (2006.01);
U.S. Cl.
CPC ...
C12M 41/06 (2013.01); C12M 25/00 (2013.01); C12M 31/00 (2013.01); G01N 21/75 (2013.01);
Abstract

A sensor device according to the present technology includes a stack sensor. The stack sensor includes a first sensor layer and a second sensor layer. The first sensor layer has, as a detection target, a first substrate in a culture solution, the first substrate being changed in accordance with a change in a state of a cell. The second sensor layer has, as a detection target, a second substrate in the culture solution and is provided on the first sensor layer, the second substrate being changed in accordance with the change in the state.

Find Patent Forward Citations

Takemura, Ichiro. (2022). Sensor device and detection apparatus (U.S. Patent No. 11459537). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11459537

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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