The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Aug. 06, 2020
Applicant:

Argo Ai, Llc, Pittsburgh, PA (US);

Inventors:

Casey J. Sennott, Pittsburgh, PA (US);

Morgan M. Wagner, Pittsburgh, PA (US);

Dustin Ryan Yautz, Wexford, PA (US);

Assignee:

ARGO AI, LLC, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60W 50/02 (2012.01); B60S 1/54 (2006.01); B60S 1/46 (2006.01); B60Q 11/00 (2006.01); B60W 50/04 (2006.01);
U.S. Cl.
CPC ...
B60W 50/0205 (2013.01); B60Q 11/00 (2013.01); B60S 1/46 (2013.01); B60S 1/54 (2013.01); B60W 50/04 (2013.01); B60W 2050/0215 (2013.01); B60W 2556/20 (2020.02); B60W 2556/25 (2020.02);
Abstract

Devices, systems, and methods are provided for enhanced sensor cleaning validation. A device may determine a baseline performance measurement associated with a clean performance baseline of a sensor. The device may actuate a cleaning mechanism to remove at least a portion of an obstruction deposited on the sensor. The device may determine a first post-clean performance measurement associated with the sensor. The device may determine a degradation measurement between the baseline performance measurement and the first post-clean performance measurement, wherein the degradation measurement indicates an effectiveness of the cleaning mechanism.


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