The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Nov. 22, 2019
Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventor:

Alexander Jobe Fix, Seattle, WA (US);

Assignee:

META PLATFORMS TECHNOLOGIES, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); G02C 5/00 (2006.01); A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61F 9/007 (2006.01); A61B 3/107 (2006.01); A61F 9/00 (2006.01); A61F 9/008 (2006.01);
U.S. Cl.
CPC ...
A61F 9/007 (2013.01); A61B 3/0008 (2013.01); A61B 3/0025 (2013.01); A61B 3/107 (2013.01); A61B 3/14 (2013.01); A61F 2009/0052 (2013.01); A61F 2009/00872 (2013.01); A61F 2009/00882 (2013.01);
Abstract

Techniques are described for generating and using an illumination pattern for corneal topography. The illumination pattern is projected onto an eye of a user wearing a head-mounted assembly. The illumination pattern is based on a reference pattern and corresponds to selective illumination of dots arranged along a two-dimensional grid. An image sensor captures a reflected image produced by reflection of the illumination pattern off the eye. A reflected pattern is identified based on glints in the reflected image and mapped to the reference pattern to generate an aligned reflected pattern. An eye model including a topography of a cornea is calculated by comparing the aligned reflected pattern to the reference pattern to determine a deviation in a shape of the cornea based on a difference between the aligned reflected pattern and the reference pattern. The eye model can be applied in various ways, including for eye tracking or biometric authentication.


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