The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Feb. 09, 2018
Applicant:

University of Tsukuba, Ibaraki, JP;

Inventor:

Hiroyuki Kudo, Tsukuba, JP;

Assignee:

UNIVERSITY OF TSUKUBA, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/4078 (2013.01); A61B 6/469 (2013.01); G06T 11/005 (2013.01); G06T 11/006 (2013.01); G06T 2211/416 (2013.01); G06T 2211/432 (2013.01);
Abstract

An image generation method of an interior CT includes the following steps: a step for obtaining interior CT projection data by measuring quantum beams passing through a region of interest (ROI) in an inside of photographing object in a geometrical system for CT measurement; a step for obtaining partial entire projection data by measuring quantum beams passing through an entire of said photographing object from a segment in an outside of said photographing object in said geometrical system for CT measurement; and a processing step for exactly reconstructing said ROI upon basis of said interior CT projection data obtained and said partial entire projection data.


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