The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Apr. 02, 2019
Applicant:

School Juridical Person Kitasato Institute, Tokyo, JP;

Inventors:

Satoru Nebuya, Sagamihara, JP;

So Hifumi, Sagamihara, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/0536 (2021.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0536 (2013.01); A61B 5/683 (2013.01); A61B 5/6823 (2013.01); A61B 2562/0261 (2013.01);
Abstract

A measurement device has a measurement belt to which a plurality of electrode pads arranged in a row and a plurality of strain gauges arranged in parallel to the plurality of electrode pads are integrally adhered and configured to be used after being wrapped around a portion serving as a measurement target of a living body; and a processor configured to: acquire an image of the portion serving as the measurement target while applying a current to the plurality of electrode pads and acquiring a voltage signal generated between the electrode pads; and estimate a contour shape of the portion serving as the measurement target and a size of the contour shape on the basis of curvature data acquired via the plurality of strain gauges.


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