The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Dec. 12, 2019
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Shigeyuki Mori, Osaka, JP;

Koji Funami, Kyoto, JP;

Masahiro Mori, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 1/00 (2006.01); H01S 5/00 (2006.01); G01B 11/27 (2006.01); G02B 19/00 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0014 (2013.01); G01B 11/27 (2013.01); G02B 19/0057 (2013.01);
Abstract

A light source measurement apparatus includes an objective lens that collects light emitted from a light source having a plurality of light emission points, a first reflection attenuation filter, a second reflection attenuation filter, a condensing lens, a space filter, and a movable stage, in which the first reflection attenuation filter and the second reflection attenuation filter are disposed such that polarization directions are orthogonal to each other, in which the space filter has an opening through which light emitted from a measurement target light emission point among the plurality of light emission points is transmitted, and in which the opening has a shape in which a dimension of the measurement target light emission point in a fast direction is larger than a dimension of the measurement target light emission point in a slow direction.


Find Patent Forward Citations

Loading…