The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Dec. 26, 2018
Applicant:

Japan Science and Technology Agency, Kawaguchi, JP;

Inventors:

Junichiro Shiomi, Tokyo, JP;

Makoto Kashiwagi, Tokyo, JP;

Takashi Kodama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 35/22 (2006.01); H01L 35/34 (2006.01); C01B 33/02 (2006.01); B22F 1/00 (2022.01); B22F 1/054 (2022.01);
U.S. Cl.
CPC ...
H01L 35/22 (2013.01); B22F 1/054 (2022.01); C01B 33/02 (2013.01); H01L 35/34 (2013.01); B22F 2301/255 (2013.01); B22F 2304/054 (2013.01); C01P 2004/03 (2013.01); C01P 2004/04 (2013.01); C01P 2004/62 (2013.01); C01P 2004/64 (2013.01); C01P 2006/32 (2013.01); C01P 2006/40 (2013.01);
Abstract

Provided is a silicon bulk thermoelectric conversion material in which thermoelectric performance is improved by reducing the thermal conductivity as compared with the prior art. In the silicon bulk thermoelectric conversion material, the ZT is greater than 0.2 at room temperature with the elemental silicon. In the silicon bulk thermoelectric conversion material, a plurality of silicon grains have an average of 1 nm or more and 300 nm or less, a first hole have an average of 1 nm or more and 30 nm or less present in the plurality of silicon grains and surfaces of the silicon grains, and a second hole have an average of 100 nm or more and 300 nm or less present between the plurality of silicon grains, wherein the aspect ratio of a crystalline silicon grain is less than 10.


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