The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Oct. 02, 2018
Applicant:

Interdigital Vc Holdings, Inc., Wilmington, DE (US);

Inventors:

Kangying Cai, Rennes, FR;

Celine Guede, Cesson-Sevigne, FR;

Joan Llach Pinsach, Cesson-Sevigne, FR;

Sebastien Lasserre, Thorigné Fouillard, FR;

Assignee:

InterDigital VC Holdings, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 9/00 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06T 9/00 (2013.01); G06T 19/20 (2013.01); G06T 2210/56 (2013.01); G06T 2219/2012 (2013.01);
Abstract

This method for up-sampling a point cloud representing a 3D object, comprises: —detecting () points belonging to at least one under-sampled region of the point cloud on the basis of at least one desirable sampling rate (K); —obtaining (), for each detected point, an associated tangent plane; —inserting () in the point cloud at least one neighboring point of each detected point if a distance between the neighboring point and the tangent plane associated with the detected point is less than a first threshold.


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