The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Jan. 31, 2020
Applicants:

Andrew Timothy Jang, San Mateo, CA (US);

Nai-yuan Nicholas Chang, San Francisco, CA (US);

Inventors:

Andrew Timothy Jang, San Mateo, CA (US);

Nai-Yuan Nicholas Chang, San Francisco, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 5/00 (2006.01); A61C 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 5/0035 (2013.01); A61B 5/0073 (2013.01); A61B 5/0088 (2013.01); A61B 5/4547 (2013.01); A61B 5/7425 (2013.01); A61C 9/0053 (2013.01); A61B 2562/0238 (2013.01); G06T 2207/30036 (2013.01);
Abstract

An imaging system comprises multiple light sources, a beam combiner, an optical array sensor, and a computing device. A first light source forms a first beam of light at a first wavelength. A second light source forms a second beam of light at a second wavelength. The beam combiner combines the first beam of light and the second beam of light into a single beam of light and illuminates a specimen with the single beam of light. The optical array sensor detects reflected light that is reflected from the specimen. The computing device accesses sensor data from the optical array sensor, forms a first image based on the first wavelength and a second image based on the second wavelength, and forms a composite image from the first image and the second image.


Find Patent Forward Citations

Loading…