The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Jan. 31, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Rahul Vishwakarma, Bangalore, IN;

Hemant Gaikwad, Bangalore, IN;

Gopal Singh, Lucknow, IN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06N 20/20 (2019.01); G06K 9/62 (2022.01); G06F 3/06 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06F 3/0617 (2013.01); G06F 3/0619 (2013.01); G06F 3/0629 (2013.01); G06F 3/0689 (2013.01); G06F 11/008 (2013.01); G06F 11/2028 (2013.01); G06K 9/6257 (2013.01);
Abstract

Methods, apparatus, and processor-readable storage media for automatically allocating device resources using machine learning techniques are provided herein. An example computer-implemented method includes determining values for multiple parameters from data obtained from one or more devices; generating at least one device component failure prediction by applying one or more machine learning techniques to at least a portion of the determined values; computing one or more qualifying values attributable to the at least one generated device component failure prediction by providing the at least one generated device component failure prediction to a conformal prediction framework; and automatically allocating one or more resources to at least a portion of the one or more devices based at least in part on the at least one generated device component failure prediction and the one or more computed qualifying values.


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