The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2022
Filed:
Nov. 14, 2019
International Business Machines Corporation, Armonk, NY (US);
Weichen Wang, Cary, NC (US);
Eliza Salkeld, Raleigh, NC (US);
Shanna Hayes, Cary, NC (US);
Lucy Lu, Durham, NC (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A detection modeling system performs a distribution analysis to alert to model degradation. The detection modeling system may have a distribution analysis module configured to perform an alerting process in conjunction with a processing device. The distribution analysis module may receive a risk tolerance rating for alerting to degradation of an analytical model, and determine a threshold value for a model metric based on the risk tolerance rating. The model metric may be a measure of a parameter associated with the analytical model. The distribution analysis module may also monitor the analytical model for degradation using the threshold value for the model metric and model metric values and alert to model degradation of the analytical model based on the monitoring of the analytical model.