The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2022
Filed:
May. 23, 2019
Palantir Technologies Inc., Palo Alto, CA (US);
Ezra Spiro, New York, NY (US);
Andre Frederico Cavalheiro Menck, New York, NY (US);
Anshuman Prasad, New York, NY (US);
Arthur Thouzeau, London, GB;
Caroline Henry, London, GB;
Charles Shepherd, London, GB;
Joanna Peller, London, GB;
Jennifer Yip, Wembley, GB;
Marco Diciolla, London, GB;
Matthew Todd, London, GB;
Peter Maag, Brooklyn, NY (US);
Spencer Tank, New York, NY (US);
Thomas Powell, London, GB;
Palantir Technologies Inc., Denver, CO (US);
Abstract
Systems, methods, non-transitory computer readable media can be configured to access a plurality of sensor logs corresponding to a first machine, each sensor log spanning at least a first period; access first computer readable logs corresponding to the first machine, each computer readable log spanning at least the first period, the computer readable logs comprising a maintenance log comprising a plurality of maintenance task objects, each maintenance task object comprising a time and a maintenance task type; determine a set of statistical metrics derived from the sensor logs; determine a set of log metrics derived from the computer readable logs; and determine, using a risk model that receives the statistical metrics and log metrics as inputs, fault probabilities or risk scores indicative of one or more fault types occurring in the first machine within a second period.