The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Jan. 22, 2019
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Matteo Bardini, Genoa, IT;

Francesco Volpi, Genua, IT;

Alessio Dellacha, Genoa, IT;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06Q 10/00 (2012.01); G06Q 10/04 (2012.01); G06Q 10/06 (2012.01); G06N 20/10 (2019.01); G06N 20/00 (2019.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 11/3013 (2013.01); G06F 11/3419 (2013.01); G06N 5/045 (2013.01); G06N 20/00 (2019.01); G06N 20/10 (2019.01); G06Q 10/04 (2013.01); G06Q 10/06393 (2013.01); G06Q 10/20 (2013.01);
Abstract

A system and method detect and forecast a performance degradation of a M-system. The method includes collecting data regarding the M-System during a period of time P1, storing the collected data in a database and analyzing the collected data collected during the period of time P1 by an elaboration routine containing two distinct elaboration phases. Namely, a first elaboration phase, where a performance analysis system selects among the collected data a set of data to be analyzed and removes any noisy data from the set of data and a second elaboration phase, where the performance analysis system correlates, for the set of data, data belonging to different sources, but generated at a same time within the period of time P1 to create M-System state data snapshots characterizing the M-System at different times Ti within the period of time P1. Finally, a model for the M-System is generated from input datasets.


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