The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2022
Filed:
Apr. 14, 2020
Sap SE, Walldorf, DE;
Jan Portisch, Bruchsal, DE;
Ronald Boehle, Dielheim, DE;
Volker Saggau, Bensheim, DE;
Sandra Bracholdt, Dielheim, DE;
SAP SE, Walldorf, DE;
Abstract
Techniques and solutions are described for determining a set of elements of a second set that may correspond to a given element of a first set of elements. The elements can be, in specific examples, components of a database system, such as tables (or entities), attributes, or records. Significance metric values are calculated for elements in the first and second sets. The significance metric values can be a number of records in an entity or a number of read or write access operations for an entity or for a record of an entity. A significance metric value for the given element can be used at least in part to select elements of the second set as potential match candidates, based at least in part on significance metric values for elements of the second set. Selecting elements can include selecting elements based on a window of elements of the second set or a range of significance metric values.