The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Oct. 11, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Alexandru Nagy, Gilroy, CA (US);

Kellie Arciszewski, San Jose, CA (US);

Jimmy Y. Wong, Saratoga, CA (US);

Dean W. Stuenkel, Gilroy, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2273 (2013.01); G06F 11/079 (2013.01); G06F 11/0766 (2013.01);
Abstract

Provided are a computer program product, system, and method for using system errors and manufacturer defects in system components causing the system errors to determine a quality assessment value for the components. A system error message indicates at least one at least one system error resulting from an operation of at least one component deployed in the system. A manufacturing defect for the at least one component whose operation results in the at least one system error is determined from information from a manufacturer of the component. A quality assessment value is determined from the system error and manufacturing defect, for each of the at least one component for which there is a manufacturing defect. A message is transmitted to an administrator of the system indicating a negative assessment of the component in response to a comparison of the quality assessment value and a threshold value indicate a negative assessment.


Find Patent Forward Citations

Nagy, Alexandru. (2022). Using system errors and manufacturer defects in system components causing the system errors to determine a quality assessment value for the components (U.S. Patent No. 11455223). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11455223

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…